Symposium G: Scanning Probe Microscopy in Materials Research
Chair
- N. CHANDRASEKHAR, Institute of Materials Research and Engineering, Singapore
Co-Chairs
- Sean J. O’SHEA, Institute of Materials Research and Engineering,Singapore
- Venky NARAYANAMURTI, Harvard University, USA
- Karl-Heinz RIEDER, EMPA – Swiss Federal Laboratories for Materials Research, Zurich, Switzerland
Correspondence:
N. CHANDRASEKHAR
Institute of Materials Research and Engineering, 3 Research Link, Singapore 117602
Tel: (65) 6874 8586, Fax: (65) 6774 4657,
E-mail: ;
Overview
The SPM has become an indispensable tool in physics, chemistry, engineering, and life sciences since the invention of the STM in 1981. We propose a symposium devoted to scanning probe microscopies. The symposium will cover recent advances in scanning probe techniques namely STM, AFM and SNOM.
Topics
- Bio- & macromolecules and polymers
- Semiconductor and metal surface structure
- Adsorbates and reactions on semiconductor and metal surfaces
- Magnetic systems
- Nanotubes and 1-D wires
- Catalysis & electrochemistry
- Nano-optical phenomena
- Interaction within and between single molecules
- Atom and molecular manipulation
- Nano-patterning
- Oxides
- Cells and biological systems
- Theory of probe-matter interactions
- Tip preparation and functionalization
- Bottom-up processes
- Molecular electronics
Keynote Speakers
- Masakazu AONO, NIMS, Japan
- Richard BERNDT, University of Kiel, Germany
- Maki KAWAI, Tokyo University, Japan
- Ernst MEYER, University of Basel, Switzerland
- Gerhard MEYER, IBM Zurich Research Lab, Switzerland
- Seizo MORITA, Osaka University, Japan
- Karl-Heinz RIEDER, EMPA – Swiss Federal Laboratories for Materials Research, Germany
Invited Speakers
- Flemming BESENBACHER, University of Aarhus, Denmark
- Peter BETON, University of Nottingham, UK
- Gerald DUJARDIN, University Paris-Sud, France
- Stefan FOLSCH, Paul Drude Institute, Germany
- S. GAUTHIER, CEMES, CNRS, France
- Allen M. GOLDMAN, University of Minnesota, USA
- Leonhard GRILL, Free University, Germany
- Masahiko HARA, Tokyo Institute of Technology and RIKEN, Japan
- Andreas HEINRICH, IBM Almaden, USA
- S. W. HLA, University of Ohio, USA
- Christian JOACHIM, CEMES, CNRS, France
- Tomji KAWAI, Osaka University, Japan
- Young KUK, Seoul National University, Korea
- LEE Haiwon, Hanyang University, Korea
- Frederico ROSEI, University of Quebec, Canada
- Frank RUESS, University of New South Wales, Australia
- San-Qiang SHI, Hong Kong Polytechnic University, China
- Kar Seng TENG, University of Wales, UK
- Roland WIESENDANGER, University of Hamburg, Germany
- Robert WOLKOW, University of Alberta, Canada
- ZHANG Hua, Nanyang Technological University, Singapore
Manuscript Publication
Submission Deadline: 20th June 2007
Proceedings of this Symposium (invited, contributed – oral and poster papers) which were presented at the ICMAT meeting will appear in :
Journal of Scanning Probe Microscopy
Submission Instructions
1. Instructions for authors may be found at this website
2. JSPM is indexed in Chemical Abstracts, Web of Science and other databases.
3. You may follow either the “communications” or “research article style”.
4. Contributed papers are limited to 3 published/printed journal pages due to strict page limits imposed by the journal.
5. Invited/keynote papers may be upto 5 printed pages.
6. All papers are to be uploaded as either MS Word (preferred) or PDF files ONLINE SUBMISSION
Papers are to be submitted online using the same login ID you had used to submit your abstract earlier.
7. All papers will be refereed as per standard JSPM procedures.
8. Please note that page lengths guidelines are to be strictly followed. Failure to comply with these guidelines may result in rejection of your papers since the symposium chairs are working on a very tight schedule for publication, and do not have time for editorial adjudication with authors on articles that do not meet with the specifications.
9. It is anticipated that the proceedings will be published in early 2008 in JSPM.
Your cooperation is greatly appreciated and gratefully acknowledged by the Symposium Chairs.